Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
HAIS
/
Paper
Visual Analytics for Production Line Failure Detection.
Unai Arrieta
,
Ander Garca
,
Mikel Lorente
,
ngel Maleta
Venue
National
HAIS
Year
2020
Proceedings
HAIS
DBLP record
conf/hais/ArrietaGLM20 ↗
Browse the full
HAIS paper archive
.