Local Binary Pattern Features to Detect Anomalies in Machined Workpiece.
Lidia Snchez-Gonzlez, Virginia Riego, Manuel Castejn Limas, Laura Fernndez-Robles
Browse the full HAIS paper archive.
Lidia Snchez-Gonzlez, Virginia Riego, Manuel Castejn Limas, Laura Fernndez-Robles
Browse the full HAIS paper archive.