Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem.

Xiaosong Du, Praveen Gurrala, Leifur Leifsson, Jiming Song, William Q. Meeker, Ronald A. Roberts, Slawomir Koziel, Yonatan A. Tesfahunegn

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