BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments.

Eric J. Lingerfelt, Alex Belianinov, Eirik Endeve, O. Ovchinnikov, Suhas Somnath, Jose M. Borreguero, N. Grodowitz, B. Park, Richard K. Archibald, Christopher T. Symons, Sergei V. Kalinin, O. E. Bronson Messer, Mallikarjun Shankar, Stephen Jesse

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