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Assessment of False Identity by Variability in Operating Condition for Memristor Write Time-Based Device Fingerprints.

Ha-Phuong Nguyen, The-Nghia Nguyen, Nhat-An Nguyen, SungHyun Park, Yeong-Seok Seo, Dosam Hwang, Donghwa Shin

VenueBICCCI
Year2020
ProceedingsICCCI

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