LLM - TG: Towards Automated Test Case Generation for Processors Using Large Language Models.

Yifei Deng, Renzhi Chen, Chao Xiao, Zhijie Yang, Yuanfeng Luo, Jingyue Zhao, Na Li, Zhong Wan, Yongbao Ai, Huadong Dai, Lei Wang

Browse the full ICCD paper archive.