The Devil is in the Crack Orientation: A New Perspective for Crack Detection.
Zhuangzhuang Chen, Jin Zhang, Zhuonan Lai, Guanming Zhu, Zun Liu, Jie Chen, Jianqiang Li
Browse the full ICCV paper archive.
Zhuangzhuang Chen, Jin Zhang, Zhuonan Lai, Guanming Zhu, Zun Liu, Jie Chen, Jianqiang Li
Browse the full ICCV paper archive.