Test Data Generation for Database Applications.
Pooja Agrawal, Bikash Chandra, K. Venkatesh Emani, Neha Garg, S. Sudarshan
Browse the full ICDE paper archive.
Pooja Agrawal, Bikash Chandra, K. Venkatesh Emani, Neha Garg, S. Sudarshan
Browse the full ICDE paper archive.