A new object based quality metric based on SIFT and SSIM.
Marc Decombas, Frdric Dufaux, Erwann Renan, Batrice Pesquet-Popescu, Franois Capman
Browse the full ICIP paper archive.
Marc Decombas, Frdric Dufaux, Erwann Renan, Batrice Pesquet-Popescu, Franois Capman
Browse the full ICIP paper archive.