A Tool for Printed Circuit Board Defect Detection based on the YOLO Algorithm.
Miao Hou, Zhiming Lan, Qiuhong Hong, Xiangyuan Zhu, Hong Nie
Browse the full ICNC paper archive.
Miao Hou, Zhiming Lan, Qiuhong Hong, Xiangyuan Zhu, Hong Nie
Browse the full ICNC paper archive.