A general framework to detect behavioral design patterns.
Cong Liu, Boudewijn F. van Dongen, Nour Assy, Wil M. P. van der Aalst
Browse the full ICSE paper archive.
Cong Liu, Boudewijn F. van Dongen, Nour Assy, Wil M. P. van der Aalst
Browse the full ICSE paper archive.