A Topic Model and Test History-Based Test Case Recommendation Method for Regression Testing.
Hirohisa Aman, Takashi Nakano, Hideto Ogasawara, Minoru Kawahara
Browse the full ICST paper archive.
Hirohisa Aman, Takashi Nakano, Hideto Ogasawara, Minoru Kawahara
Browse the full ICST paper archive.