Skip to content

A Workflow for Automated Testing of a Safety-Critical Embedded Subsystem.

Michele Ignarra, Maria Guarino, Andrea Aiello, Vincenzo Tonziello, Giovanni De Donato, Emanuele Pascale, Renato De Guglielmo, Antonio Costa, Cosimo Affuso

VenueAICST
Year2025
ProceedingsICSTW

Browse the full ICST paper archive.