Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines.
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
Browse the full ICST paper archive.
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
Browse the full ICST paper archive.