Reduce Test Cost by Reusing Test Oracles through Combinatorial Join.
Hiroshi Ukai, Xiao Qu, Hironori Washizaki, Yoshiaki Fukazawa
Browse the full ICST paper archive.
Hiroshi Ukai, Xiao Qu, Hironori Washizaki, Yoshiaki Fukazawa
Browse the full ICST paper archive.