Repairing Fragile GUI Test Cases Using Word and Layout Embedding.
Juyeon Yoon, Seungjoon Chung, Kihyuck Shin, Jinhan Kim, Shin Hong, Shin Yoo
Browse the full ICST paper archive.
Juyeon Yoon, Seungjoon Chung, Kihyuck Shin, Jinhan Kim, Shin Hong, Shin Yoo
Browse the full ICST paper archive.