Optimizing Model-based Generated Tests: Leveraging Machine Learning for Test Reduction.
Muhammad Nouman Zafar, Wasif Afzal, Eduard Paul Enoiu, Zulqarnain Haider, Inderjeet Singh
Browse the full ICST paper archive.
Muhammad Nouman Zafar, Wasif Afzal, Eduard Paul Enoiu, Zulqarnain Haider, Inderjeet Singh
Browse the full ICST paper archive.