Two-Face: Adversarial Audit of Commercial Face Recognition Systems.
Siddharth D. Jaiswal, Karthikeya Duggirala, Abhisek Dash, Animesh Mukherjee
Browse the full ICWSM paper archive.
Siddharth D. Jaiswal, Karthikeya Duggirala, Abhisek Dash, Animesh Mukherjee
Browse the full ICWSM paper archive.