Experimental Estimation of Parasitic Capacitance of Thermal Interface Material Using Double Pulse Test Circuit under Realistic Operating Conditions.
Kalyani V. Lande, J. Satheesh Reddy, Arun Karuppaswamy B
Browse the full IECON paper archive.
Kalyani V. Lande, J. Satheesh Reddy, Arun Karuppaswamy B
Browse the full IECON paper archive.