Physical Layer Authentication Based on Residual Network for Industrial Wireless CPSs.
Fei Pan, Xiaofan Li, Haibo Pu, Yan Guo, Jiangchuan Liu
Browse the full IECON paper archive.
Fei Pan, Xiaofan Li, Haibo Pu, Yan Guo, Jiangchuan Liu
Browse the full IECON paper archive.