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A Physics-Informed Pattern Recognition Method for Open-Circuit Fault Detection of Inverters Under Unexpected Conditions.

Yu Zeng, Josep Pou, Huamin Jie, Jiaxin Dong, Hebin Ruan, Janardhana Kotturu, Marco Cupelli, Amit Kumar Gupta

VenueCIECON
Year2023
ProceedingsIECON

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