Crop Yield Modelling Applying Leaf Area Index Estimated from Sentinel-2 and Proba-V Data at JECAM site in Poland.

Katarzyna Dabrowska-Zielinska, Maciej Bartold, Radoslaw Gurdak, Martyna Gatkowska, Wojciech Kiryla, Zbigniew Bochenek, Alicja Malinska

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