Skip to content

SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images.

Fuqin Deng, Qiqing Dong, Junhan Pu, Lanhui Fu, Qingshan Xia, Zhi Xu, Nannan Li, Min Zhao

VenueCINDIN
Year2025
ProceedingsINDIN

Browse the full INDIN paper archive.