Segment Anything in Industrial defect detection.
Fuqin Deng, Zhi Xu, Lanhui Fu, Min Zhao, Nannan Li, Song Lu, Hufei Zhu, Qingshan Xia
Browse the full INDIN paper archive.
Fuqin Deng, Zhi Xu, Lanhui Fu, Min Zhao, Nannan Li, Song Lu, Hufei Zhu, Qingshan Xia
Browse the full INDIN paper archive.