Skip to content

A Scalable Die-to-Die Interconnect with Replay and Repair Schemes for 2.5D/3D Integration.

Jie Liao, Bo Jiao, Jinshan Zhang, Shiwei Liu, Hao Jiang, Jun Tao, Wenning Jiang, Qi Liu, Lihua Zhang, Haozhe Zhu, Chixiao Chen

VenueCISCAS
Year2023
ProceedingsISCAS

Browse the full ISCAS paper archive.