Assessing software reliability performance under highly critical but infrequent event occurrences.
M. S. Alam, W. H. Chen, Willa K. Ehrlich, M. E. Engel, D. A. Kropfl, P. Verma
Browse the full ISSRE paper archive.
M. S. Alam, W. H. Chen, Willa K. Ehrlich, M. E. Engel, D. A. Kropfl, P. Verma
Browse the full ISSRE paper archive.