Connecting Software Reliability Growth Models to Software Defect Tracking.
Maskura Nafreen, Melanie Luperon, Lance Fiondella, Vidhyashree Nagaraju, Ying Shi, Thierry Wandji
Browse the full ISSRE paper archive.
Maskura Nafreen, Melanie Luperon, Lance Fiondella, Vidhyashree Nagaraju, Ying Shi, Thierry Wandji
Browse the full ISSRE paper archive.