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Paper
Robust and Effective Metric Learning Using Capped Trace Norm: Metric Learning via Capped Trace Norm.
Zhouyuan Huo
,
Feiping Nie
,
Heng Huang
Venue
A*
KDD
Year
2016
Proceedings
KDD
DBLP record
conf/kdd/HuoNH16 ↗
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