Operating System Mechanisms for TPM-Based Lifetime Measurement of Process Integrity.
Xiao Li, Wenchang Shi, Zhaohui Liang, Bin Liang, Zhiyong Shan
Browse the full MASS paper archive.
Xiao Li, Wenchang Shi, Zhaohui Liang, Bin Liang, Zhiyong Shan
Browse the full MASS paper archive.