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ssEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features.

Inwan Yoo, David G. C. Hildebrand, Willie F. Tobin, Wei-Chung Allen Lee, Won-Ki Jeong

VenueAMICCAI
Year2017
ProceedingsDLMIA/ML-CDS@MICCAI

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