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Paper
PatentEval: Understanding Errors in Patent Generation.
You Zuo
,
Kim Gerdes
,
ric de la Clergerie
,
Benot Sagot
Venue
A
NAACL
Year
2024
Proceedings
NAACL-HLT
DBLP record
conf/naacl/ZuoGCS24 ↗
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