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UTRAN O&M support system with statistical fault identification and customizable rule sets.

Yoshinori Watanabe, Yasuhiko Matsunaga, Kosei Kobayashi, Toshio Tonouchi, Tomohiro Igakura, Shinji Nakadai, Kenichirou Kamachi

VenueBNOMS
Year2008
ProceedingsNOMS

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