Diagnosis Model of Radio Frequency Impedance Matching in Plasma Equipment by Using Neural Network and Wavelets.
Byungwhan Kim, Jae Young Park, Donghwan Kim, Seung Soo Han
Browse the full PRICAI paper archive.
Byungwhan Kim, Jae Young Park, Donghwan Kim, Seung Soo Han
Browse the full PRICAI paper archive.