Skip to content

How Does Defect Removal Activity of Developer Vary with Development Experience?

Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto

VenueCSEKE
Year2015
ProceedingsSEKE

Browse the full SEKE paper archive.