Is This Side Up? Detecting Upside-Down Exception with Passive RFID.
Jia Liu, Haipeng Dai, Yingli Yan, Xiaocong Zhang, Xingyu Chen, Lijun Chen
Browse the full SmartComp paper archive.
Jia Liu, Haipeng Dai, Yingli Yan, Xiaocong Zhang, Xingyu Chen, Lijun Chen
Browse the full SmartComp paper archive.