A pattern classifier for interval-valued data based on multinomial logistic regression model.
Alberto Pereira de Barros, Francisco de Assis Tenrio de Carvalho, Eufrsio de Andrade Lima Neto
Browse the full SMC paper archive.
Alberto Pereira de Barros, Francisco de Assis Tenrio de Carvalho, Eufrsio de Andrade Lima Neto
Browse the full SMC paper archive.