Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature.
Seung-Bo Lee, Hakseung Kim, Seho Lee, Hyun-Ji Kim, Seong-Whan Lee, Dong-Joo Kim
Browse the full SMC paper archive.
Seung-Bo Lee, Hakseung Kim, Seho Lee, Hyun-Ji Kim, Seong-Whan Lee, Dong-Joo Kim
Browse the full SMC paper archive.