Frequency Dependence of Electron Emission Current from Crystal Defects in AlGaN/GaN HEMTs.
Hideki Hoji, Soichi Sano, Jyunya Takeda, Hirohisa Taguchi
Browse the full Tencon paper archive.
Hideki Hoji, Soichi Sano, Jyunya Takeda, Hirohisa Taguchi
Browse the full Tencon paper archive.