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AI-Based Modeling of a Microwave Elliptical Sensor for Dielectric Measurement of Agricultural Samples.

Kim Yee Lee, Gobi Vetharatnam, Yong-Hong Lee, Eng Hock Lim, Cheng Ee Meng, Kok Yeow You

VenueCTencon
Year2025
ProceedingsTENCON

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