Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
Tencon
/
Paper
A Novel Test Coverage Metric for Safety-Critical Software.
Debashis Mukherjee
Venue
C
Tencon
Year
2019
Proceedings
TENCON
DBLP record
conf/tencon/Mukherjee19 ↗
Browse the full
Tencon paper archive
.