Software Defect Prediction Model Based On KPCA-SVM.
Yan Zhou, Chun Shan, Shiyou Sun, Shengjun Wei, Sicong Zhang
VenueCUIC
Year2019
ProceedingsSmartWorld/SCALCOM/UIC/ATC/CBDCom/IOP/SCI
DBLP recordconf/uic/ZhouSSWZ19 ↗
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