Unveiling the Tricks: Automated Detection of Dark Patterns in Mobile Applications.
Jieshan Chen, Jiamou Sun, Sidong Feng, Zhenchang Xing, Qinghua Lu, Xiwei Xu, Chunyang Chen
Browse the full UIST paper archive.
Jieshan Chen, Jiamou Sun, Sidong Feng, Zhenchang Xing, Qinghua Lu, Xiwei Xu, Chunyang Chen
Browse the full UIST paper archive.