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Impression estimation model and pattern search system based on style features and Kansei metric.

Natsuki Sunda, Kensuke Tobitani, Atsushi Takemoto, Iori Tani, Yusuke Tani, Taishi Fujiwara, Noriko Nagata, Nobufumi Morita

VenueBVRST
Year2018
ProceedingsVRST

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