Effective Puncturing Schemes for Block-type Low-Density Parity-Check Codes.
Sunghoon Choi, You-Chul Shin, Jun Heo, Kihyoung Cho, Minseok Oh
Browse the full VTC paper archive.
Sunghoon Choi, You-Chul Shin, Jun Heo, Kihyoung Cho, Minseok Oh
Browse the full VTC paper archive.