Code and Test Generation for I4.0 State Machines with LLM-based Diagram Recognition.
Bjrn Otto, Assanali Aidarkhan, Marko Ristin, Nico Braunisch, Christian Diedrich, Hans Wernher van de Venn, Martin Wollschlaeger
Browse the full WFCS paper archive.
Bjrn Otto, Assanali Aidarkhan, Marko Ristin, Nico Braunisch, Christian Diedrich, Hans Wernher van de Venn, Martin Wollschlaeger
Browse the full WFCS paper archive.