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Code and Test Generation for I4.0 State Machines with LLM-based Diagram Recognition.

Bjrn Otto, Assanali Aidarkhan, Marko Ristin, Nico Braunisch, Christian Diedrich, Hans Wernher van de Venn, Martin Wollschlaeger

VenueCWFCS
Year2025
ProceedingsWFCS

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