A. Hakan Baba
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2009–2009
Best venue rank
C
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ICCD | Framework for massively parallel testing at wafer and package test. | A. Hakan Baba, Kee Sup Kim |
| 2009 | VTS | Testing for Transistor Aging. | A. Hakan Baba, Subhasish Mitra |