A. J. Briers
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1986–1986
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1986 | ITC | Random Pattern Testability by Fast Fault Simulation. | A. J. Briers, K. A. E. Totton |