| 2025 | STARTS: Simulation Traits Assisted Random Test Selection for Multiprocessor Verification. | Li Zhou, Menglong Lu, Li Luo, Jianfeng Zhang, Junbo Tie |
| 2025 | Transfer Learning for Minimum Operating Voltage Prediction in Advanced Technology Nodes: Leveraging Legacy Data and Silicon Odometer Sensing. | Yuxuan Yin, Rebecca Chen, Boxun Xu, Chen He, Peng Li |
| 2025 | Defect-Finding with Timing-Partitioned Small-Delay-Defect Methodology: Silicon Practice on N2. | Hao-Yu Yang, Hsin-Wei Hung, Nan-Hsin Tseng |
| 2025 | QuEST: Quantitative Entropy based Security and Trojan Detection Framework for Confidentiality Verification. | Jiaming Wu, Domenic Forte |
| 2025 | Device-Aware Test for Threshold Voltage Shifting in FeFET. | Changhao Wang, Sicong Yuan, Nima Kolahimahmoudi, Hanzhi Xun, Nicol Bellarmino, Danyang Chen, Chujun Yin, Mottaqiallah Taouil, Moritz Fieback, Xiuyan Li, Lin Wang, Chaobo Li, Riccardo Cantoro, Said Hamdioui |
| 2025 | Experimental Comparison of Multiplexing Methods for 28 to 64 Gbps NRZ Test Signals. | Cao Wang, Shengbo Liu, Ming Cheng, Yindong Xiao, Xiaochun Li, David C. Keezer |
| 2025 | Eclipse Dynamic Probe Card: A Novel Approach for Wafer-Level Photonic Testing with Automated Fiber Array Unit Alignment. | Riccardo Vettori, Alessia Galli |
| 2025 | Influence of Automated Test Equipment Drift on Process Capability Studies. | Anand Venkatachalam, Ernst Aderholz, Matthias Sauer, Simon Schweizer, Matthias Werner, Ilia Polian |
| 2025 | Teaching Llamas to Test: A Language-Based Approach. | Christos Vasileiou, Yiorgos Makris |
| 2025 | Chain Cell-Aware Diagnosis. | Szczepan Urban, Jakub Janicki, Piotr Zimnowlodzki, Artur Stelmach, Manish Sharma |
| 2025 | Thermal Management in System Level Test: Analysis of existing solutions and an introduction to advanced liquid cooled memory solutions. | Sridutt Tummalapalli, Srinath Reddy Yerakondappagari |
| 2025 | FeTest: Defect Analysis and March Test Solution for FeFETs | Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty |
| 2025 | NeuralTPG: GPU-Accelerated Neural Twin-Based Test Pattern Generation for Transition Delay Faults in Safety-Critical Applications. | Xuanyi Tan, Gitanjali Mukherjee, Dhruv Thapar, Arjun Chaudhuri, Sanmitra Banerjee, Rubin A. Parekhji, Krishnendu Chakrabarty |
| 2025 | Structural Testing on SLT Platform with HSAT IP & High-Speed I/O Access. | Jyotika Suri, Rakesh Kinger, Sridhar Nimmagadda, Henry Fei |
| 2025 | Scan Test for 99% Defect Coverage of R-2R DACs. | Stephen Sunter, Krzysztof Jurga |
| 2025 | Graph Attention Networks Based Fault Prediction Framework for Functional Safety Verification. | Yutao Sun, Jiehua Huang, Xiangping Liao, Zhijun Wang, Liping Liang |
| 2025 | Making IJTAG Address Physical-World Digital and Mixed-Signal Test Challenges. | Hans Martin von Staudt, Jeff Rearick, Michael Laisne |
| 2025 | Ultra dense SRAM Cell Test Challenges. | Uma Srinivasan, William V. Huott, Austen Hall, Ryan Thorpe, Daniel Rodko, Greg Hornicek, Brian Noble |
| 2025 | Advanced fault model, diagnosis and applications for deep nanometer process. | Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma |
| 2025 | Stress Aware Quiescent Current Test Optimization. | Shubhendu Shrivastava, Jo Gunnes, Anteneh Gebregiorgis, Said Hamdioui |
| 2025 | Test Data Compaction Techniques with Improved Diagnostic Capabilities and Reduced Tester Time. | Jaidev Shenoy, Virendra Singh, Kelly Ockunzzi |
| 2025 | Chasing Front-End-Of-Line Defects with Cell-Aware Diagnostics in High-Volume Manufacturing. | Saghir A. Shaikh, Brandon Brea, Gaurav Devrani, Muhammad Waheed, Lay Hoon Loh, Prakash Palanisamy, Jim Lee, Giyoung Yang |
| 2025 | Combined Array and ADC Structural Test for RRAM-based Multiply-and-Accumulate Circuits. | Emmanouil Anastasios Serlis, Hanzhi Xun, Emmanouil Arapidis, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | In-Field Testing using In-System Embedded Deterministic Test as a solution to alleviate Silent Data Corruption in AI designs. | Varun Sehgal, Subramanian Mahadevan, Ashrith S. Harith, Mohit Sharma, Saket Goyal, Nilanjan Mukherjee |
| 2025 | Silicon Photonic Test-Point Selection by Integrating Design Parameters with Hypergraph Partitioning. | Lawrence M. Schlitt, Pratishtha Agnihotri, Priyank Kalla, Steve Blair |