Device-Aware Test for Threshold Voltage Shifting in FeFET.

Changhao Wang, Sicong Yuan, Nima Kolahimahmoudi, Hanzhi Xun, Nicol Bellarmino, Danyang Chen, Chujun Yin, Mottaqiallah Taouil, Moritz Fieback, Xiuyan Li, Lin Wang, Chaobo Li, Riccardo Cantoro, Said Hamdioui

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