Moritz Fieback
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
36
Venues
6
Active years
2018–2026
Best venue rank
B
Where they publish
Papers
36 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | DATE | Analysis and Mitigation of IR Drop in Memristor-based AI Hardware Accelerators. | Emmanouil Arapidis, Theofilos Spyrou, Konstantinos Stavrakakis, Emmanouil Anastasios Serlis, Moritz Fieback, Said Hamdioui, Anteneh Gebregiorgis |
| 2026 | ETS | Structural Testing Methodology for Deep Neural Networks based on RRAM. | Emmanouil Anastasios Serlis, Emmanouil Arapidis, Theofilos Spyrou, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ASPDAC | Device-Aware Test for Anomalous Charge Trapping in FeFETs. | Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicol Bellarmino, Riccardo Cantoro, Said Hamdioui |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ETS | Structural Testing of a RRAM-based AI Accelerator Core. | Emmanouil Anastasios Serlis, Hanzhi Xun, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ETS | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | ITC | Combined Array and ADC Structural Test for RRAM-based Multiply-and-Accumulate Circuits. | Emmanouil Anastasios Serlis, Hanzhi Xun, Emmanouil Arapidis, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ITC | Device-Aware Test for Threshold Voltage Shifting in FeFET. | Changhao Wang, Sicong Yuan, Nima Kolahimahmoudi, Hanzhi Xun, Nicol Bellarmino, Danyang Chen, Chujun Yin, Mottaqiallah Taouil, Moritz Fieback, Xiuyan Li, Lin Wang, Chaobo Li, Riccardo Cantoro, Said Hamdioui |
| 2024 | DATE | Device-Aware Diagnosis for Yield Learning in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Lifecycle Management of Emerging Memories. | Moritz Fieback, Letcia Maria Veiras Bolzani Poehls |
| 2024 | ETS | Online Detection of Unique Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Design-for-Test for Intermittent Faults in STT-MRAMs. | Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Defects, Fault Modeling, and Test Development Framework for FeFETs. | Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui |
| 2024 | ITC | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? | Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | DATE | Device-Aware Test for Back-Hopping Defects in STT-MRAMs. | Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui |
| 2023 | ETS | Online Fault Detection and Diagnosis in RRAM. | Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ETS | Dependability of Future Edge-AI Processors: Pandora's Box. | Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Gneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui |
| 2023 | ETS | Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Device-Aware Test for Ion Depletion Defects in RRAMs. | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. | Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2022 | ETS | PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. | Moritz Fieback, Christopher Mnch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori |
| 2022 | ETS | Hierarchical Memory Diagnosis. | Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letcia Maria Veiras Bolzani, Said Hamdioui |
| 2022 | IOLTS | Recent Trends and Perspectives on Defect-Oriented Testing. | Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu |
| 2022 | ITC | Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. | Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui |
| 2021 | DATE | Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. | Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau |
| 2021 | ETS | Intermittent Undefined State Fault in RRAMs. | Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2021 | ETS | Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. | Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui |
| 2020 | DATE | A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. | Guilherme Cardoso Medeiros, Cemil Cem Grsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | ETS | Testing Scouting Logic-Based Computation-in-Memory Architectures. | Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | ETS | Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. | Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | VTS | Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. | Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Mnch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui |
| 2019 | ETS | DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. | Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui |
| 2019 | ITC | Device-Aware Test: A New Test Approach Towards DPPB Level. | Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ITC | Testing Computation-in-Memory Architectures Based on Emerging Memories. | Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil |
| 2018 | ITC | Testing Resistive Memories: Where are We and What is Missing? | Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |